发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To sufficiently keep the adherence of an insulating film and an electrode or wiring and to prevent drop of the dielectric constant of a capacitative element. SOLUTION: A metal layer 7A is formed on a third interlayer insulating film 5 where recessed parts 6 for forming capacitive elements are formed. The metal layer 7A is oxidized by washing. Thus, an adhesion layer 7 constituted of the sufficiently oxidized metal layer 7A is formed. Then, a Pt film 8A becoming the lower electrode of the capacitive element is formed on the adhesion layer 7.
申请公布号 JP2003158130(A) 申请公布日期 2003.05.30
申请号 JP20020260304 申请日期 2002.09.05
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KOTANI AKIHIKO;OKUNO YASUTOSHI;NAGAI TOSHIHIKO
分类号 H01L21/28;H01L21/3205;H01L21/822;H01L21/8242;H01L23/52;H01L27/04;H01L27/108 主分类号 H01L21/28
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