发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To sufficiently keep the adherence of an insulating film and an electrode or wiring and to prevent drop of the dielectric constant of a capacitative element. SOLUTION: A metal layer 7A is formed on a third interlayer insulating film 5 where recessed parts 6 for forming capacitive elements are formed. The metal layer 7A is oxidized by washing. Thus, an adhesion layer 7 constituted of the sufficiently oxidized metal layer 7A is formed. Then, a Pt film 8A becoming the lower electrode of the capacitive element is formed on the adhesion layer 7. |
申请公布号 |
JP2003158130(A) |
申请公布日期 |
2003.05.30 |
申请号 |
JP20020260304 |
申请日期 |
2002.09.05 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
KOTANI AKIHIKO;OKUNO YASUTOSHI;NAGAI TOSHIHIKO |
分类号 |
H01L21/28;H01L21/3205;H01L21/822;H01L21/8242;H01L23/52;H01L27/04;H01L27/108 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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