发明名称 OPTICAL PROBE FOR WAFER SCALE TESTING OF LIGHT-ELECTRICAL (L-I-V) PERFORMANCE OF OPTOELECTRONIC DEVICES
摘要 <p>A method of testing an edge-emitting or edge-coupled opto-electronic device comprises the step of aligning an optical probe with an optical interface of the device so that light is coupled between the optical interface and the optical probe, wherein the optical probe comprises an optical fibre having a light turning structure at a distal tip that changes the direction of propagation of light incident on the light turning structure.</p>
申请公布号 WO2003044504(A2) 申请公布日期 2003.05.30
申请号 GB2002005191 申请日期 2002.11.18
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