发明名称 METHOD FOR CLEANING METAL FILM DEPOSITION SYSTEM, AND METAL FILM DEPOSITION SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a cleaning method for carrying out cleaning for the removal of matter adhering to the inner-peripheral surface of a chamber owing to film deposition treatment. SOLUTION: Hydrogen-gas plasma is formed in the space facing the adhering matter 26 on the substrate 3 side of the chamber 1 by electrifying a plasma antenna 23 for cleaning to reduce the adhering matter 26. Subsequently, in a state where the adhering matter 26 is held at a temperature higher than the ambient temperature, Cl2 -gas plasma is formed in the above part, by which the adhering matter 26 can be etched by means of the Cl2 -gas plasma and removed.
申请公布号 JP2003155568(A) 申请公布日期 2003.05.30
申请号 JP20010351153 申请日期 2001.11.16
申请人 MITSUBISHI HEAVY IND LTD 发明人 SAKAMOTO HITOSHI;MATSUDA RYUICHI;HACHIMAN NAOKI
分类号 C23C16/44;C23C16/448;H01L21/285;(IPC1-7):C23C16/44 主分类号 C23C16/44
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