发明名称 |
METHOD FOR CLEANING METAL FILM DEPOSITION SYSTEM, AND METAL FILM DEPOSITION SYSTEM |
摘要 |
PROBLEM TO BE SOLVED: To provide a cleaning method for carrying out cleaning for the removal of matter adhering to the inner-peripheral surface of a chamber owing to film deposition treatment. SOLUTION: Hydrogen-gas plasma is formed in the space facing the adhering matter 26 on the substrate 3 side of the chamber 1 by electrifying a plasma antenna 23 for cleaning to reduce the adhering matter 26. Subsequently, in a state where the adhering matter 26 is held at a temperature higher than the ambient temperature, Cl2 -gas plasma is formed in the above part, by which the adhering matter 26 can be etched by means of the Cl2 -gas plasma and removed.
|
申请公布号 |
JP2003155568(A) |
申请公布日期 |
2003.05.30 |
申请号 |
JP20010351153 |
申请日期 |
2001.11.16 |
申请人 |
MITSUBISHI HEAVY IND LTD |
发明人 |
SAKAMOTO HITOSHI;MATSUDA RYUICHI;HACHIMAN NAOKI |
分类号 |
C23C16/44;C23C16/448;H01L21/285;(IPC1-7):C23C16/44 |
主分类号 |
C23C16/44 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|