| 摘要 |
PROBLEM TO BE SOLVED: To provide a system, a device, and a method for dynamically testing an integrated circuit. SOLUTION: The system comprises a first integrated circuit 102 having input and output pins 240, a normal operation logic 230, and a test control logic 200. The test control logic can be connected to the input pin, and is composed so that a test period is started based on the state of the input pin, and the state of the input pin is stored in a storage device during a test period. A second integrated circuit 102 of the system comprises the input and output pins 240, the normal operation logic 230, and the test control logic 200. The test control logic can be connected to the output pin and is composed to generate a set of test output signals that a user can program.
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