发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device in which the size is reduced and which does not have continuity faults. SOLUTION: The semiconductor device comprises a first electrode for bonding a semiconductor element and a second electrode connected to the element via a bonding wire formed on the front surface of a substrate, back surface electrodes corresponding to the first and second electrodes formed on the back surface of the substrate in such a manner that the first and second electrodes are electrically connected to the back surface electrodes corresponding to these electrodes via bumps formed to pass through the substrate in a perpendicular direction to the planar surface of a substrate, and the element, the bonding wire and first and second electrodes sealed with a transparent resin.
申请公布号 JP2003158218(A) 申请公布日期 2003.05.30
申请号 JP20010358052 申请日期 2001.11.22
申请人 SHARP CORP 发明人 SUZUKI MASAKO
分类号 H01L23/12;(IPC1-7):H01L23/12 主分类号 H01L23/12
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