| 摘要 |
A circuit for measuring capacitance of a capacitor that includes a PMOS device, a NMOS device, a first terminal, and a second terminal. The drains of the PMOS and NMOS devices are connected to each other, one end of the first terminal is connected between the drains of the PMOS and NMOS devices, and the other end of the first terminal and one end of the second terminal are connected respectively to two sides of a capacitor. The invention also discloses a method for measuring capacitance of a capacitor by using the circuit mentioned above.
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