发明名称 Measurement of the spatial coordinates of object points for determination of the 3-D coordinates of an object surface using an adapted line pattern projection method that results in increased accuracy for short recording times
摘要 Method for optical measurement of spatial coordinates of object points in which a coded line pattern is projected onto the surface to be measured, images of the line pattern on the object surface are recorded with a camera and from the images the surface contour of the object is determined. An evaluation method is used to generate depth data from the coded light sets that has much higher resolution than the originating coded light set data. A normalized strip image of the line pattern is created using the shortest grating period, and the resulting strip images is divided into constantly rising or constantly falling half waves using the other line patterns. The intensity values of the half waves are used to create fine-stepped sub-divisions to calculate depth data. No additional light pattern is required to produce the depth data.
申请公布号 DE10155834(A1) 申请公布日期 2003.05.28
申请号 DE20011055834 申请日期 2001.11.14
申请人 MAEHNER, BERNWARD 发明人 MAEHNER, BERNWARD
分类号 G01B11/25;G01B11/30;(IPC1-7):G01B11/25 主分类号 G01B11/25
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