发明名称 METHOD FOR FABRICATING THIN FILM TRANSISTOR
摘要 PURPOSE: A method for fabricating a thin film transistor(TFT) is provided to prevent a characteristic from being deteriorated by implanting a hydrogen component except impurities into a channel layer in implanting impurities into a semiconductor layer in a P-type TFT area or an N-type TFT area while using a gate as a mask after generating the impurities through an ion shower method. CONSTITUTION: A semiconductor layer is formed on a conductive TFT area of a substrate(30). A gate insulation layer(32) and a conductive layer(33) are sequentially formed on the substrate including the semiconductor layer. A photoresist layer pattern(34) closing the center of the semiconductor layer is formed on the conductive layer. An ion implantation process is performed through an ion shower method using the photoresist layer pattern as a mask to form a source/drain region in the semiconductor layer at both sides of the gate.
申请公布号 KR20030042052(A) 申请公布日期 2003.05.28
申请号 KR20010072465 申请日期 2001.11.20
申请人 SAMSUNG SDI CO., LTD. 发明人 CHOI, GYU HWAN;PARK, SANG IL;YOO, GYEONG JIN
分类号 H01L29/786;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/49;(IPC1-7):H01L29/786 主分类号 H01L29/786
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