发明名称 |
METHOD FOR FABRICATING THIN FILM TRANSISTOR |
摘要 |
PURPOSE: A method for fabricating a thin film transistor(TFT) is provided to prevent a characteristic from being deteriorated by implanting a hydrogen component except impurities into a channel layer in implanting impurities into a semiconductor layer in a P-type TFT area or an N-type TFT area while using a gate as a mask after generating the impurities through an ion shower method. CONSTITUTION: A semiconductor layer is formed on a conductive TFT area of a substrate(30). A gate insulation layer(32) and a conductive layer(33) are sequentially formed on the substrate including the semiconductor layer. A photoresist layer pattern(34) closing the center of the semiconductor layer is formed on the conductive layer. An ion implantation process is performed through an ion shower method using the photoresist layer pattern as a mask to form a source/drain region in the semiconductor layer at both sides of the gate. |
申请公布号 |
KR20030042052(A) |
申请公布日期 |
2003.05.28 |
申请号 |
KR20010072465 |
申请日期 |
2001.11.20 |
申请人 |
SAMSUNG SDI CO., LTD. |
发明人 |
CHOI, GYU HWAN;PARK, SANG IL;YOO, GYEONG JIN |
分类号 |
H01L29/786;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/49;(IPC1-7):H01L29/786 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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