CONTACTOR FOR SEMICONDUCTOR TESTING AND CONTACT METHOD

摘要

PURPOSE: To provide a contactor for a semiconductor device and a contact method in which mounting and deriving of an IC can be implemented with the same movement as the conventional one-point contact type socket, and a steady two-point contact can be achieved. CONSTITUTION: When an IC 10 is installed on a package receiving board 12, a bottom side contactor 23 is contacted from the downside with a terminal 10a of the IC 10. An upper side contactor 16 has a top end part 18 movable in a perpendicular direction against the terminal 10a of the IC 10 placed on the package receiving board 12. The top end part 18 is moved to the terminal 10a of the IC 10 and is made to contact the terminal 10a from the upper side by carrying out an elastic deformation by pressing the upper side contactor 16 with a pressurizing part 13 provided with an opening passing the IC 10 in the center.