发明名称 Method of cleaning a chamber of a CVD machine and elements within
摘要 The present invention provides a method of cleaning a chamber of a CVD machine and elements within. A gas mixture of carbon tetrafluoride (CF4) and perfluoro ethane (C2F6) is first injected into the chamber. After performing a surface treatment, comprising a sandblasting step or a polishing step, on the surfaces of the elements, the elements are then immersed in a cleaning solution, comprising at least ammonia water (NH4OH) and hydrogen peroxide (H2O2) at a temperature maintained between 40° C. to 70° C. Finally, the temperature of the cleaning solution is raised so that the residual layer on the surface of the elements can drop from the surfaces of the heater and the process kits or dissolve into the cleaning solution.
申请公布号 US6569253(B2) 申请公布日期 2003.05.27
申请号 US20010841010 申请日期 2001.04.25
申请人 UNITED MICROELECTRONICS CORP. 发明人 WANG WEI-HSU;CHU TSAN-CHI;YAO CHENG-YUAN;LEE WEI-HAO;CHUNG PING-CHUNG
分类号 C11D3/39;C11D7/06;C11D11/00;C23C16/44;(IPC1-7):C23G1/00 主分类号 C11D3/39
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