发明名称 Electron detectors
摘要 A cathode lens is formed between a gun electrode (8) and a specimen (9). An electron probe (11), produced as part of an electron column and suitably focused by lenses (1, 2 and 3) and scanned by suitable deflector/stigmator electrodes (2), is decelerated within the cathode lens field and its final landing energy is finely adjustable by the specimen negative bias. Emitted secondary electrons are re-accelerated within the same field and due to uniformity of this field, they increase their axial velocity only so that they are collimated into a narrow signal beam. The collimated signal beam passes mostly through an aperture (18) of electrode (8), where it enters the gun and a final lens consisting of a central earthed electrode (6) surrounded by two earthed electrodes (7) and (8). The signal beam approaches a special mirror electrode (4), the field of which decelerates and deflects the electrons further off the axis and returns them back towards the specimen (9). They are again re-accelerated in the final lens field, and impact a channel-plate electron multiplier (5) and after amplification, the signal electron beam impacts a collector (7), which can be divided into suitable parts for multichannel detection. The detector may have small dimensions and high resolution, and may be used in microscopes and other devices.
申请公布号 US6570163(B1) 申请公布日期 2003.05.27
申请号 US20000508345 申请日期 2000.04.17
申请人 UNIVERSITY OF YORK;SHIMADZU RESEARCH LABORATORY (EUROPE) LTD. 发明人 EL GOMATI MOHAMED MOCHTAR;FRANK LUDEK;MULLEROVA ILONA
分类号 G01Q70/02;H01J37/244;(IPC1-7):H01J37/28 主分类号 G01Q70/02
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