发明名称 Initial stage of a multi-stage algorithmic pattern generator for testing IC chips
摘要 An initial stage of a multi-stage algorithmic pattern generator which generates bit streams for testing IC chips, is comprised of multiple sets of input registers which store respective addresses; and an address modifying circuit that is coupled to the input registers, which receives commands, and in response, selects one register in one set and generates a modified address by performing arithmetic operations on the address in the selected register. Also, the initial stage includes a boundary check circuit that is coupled to the address modifying circuit, which stores a respective minimum limit and a respective maximum limit for each register set. This initial stage is particularly useful in generating sequences of addresses for memory cells in a chip that is to be tested, where the cells are arranged in rows and columns. When a particular Min/Max limit for a row/column is reached, then that event is remembered by the boundary check circuit. Thereafter, when the next row/column address is generated, the boundary check circuit automatically replaces the generated address (which will exceed the limit) with the proper address. This operation of detecting a limit address in one cycle, and replacing the next generated address in a subsequent cycle, enables the cycle time of the initial stage to be shorter than it otherwise could be if detection outside the limit and replacement with the proper address, occur in a single cycle.
申请公布号 US6571365(B1) 申请公布日期 2003.05.27
申请号 US19990432969 申请日期 1999.11.03
申请人 UNISYS CORPORATION 发明人 RHODES JAMES VERNON;CONKLIN ROBERT DAVID
分类号 G01R31/3183;G01R31/3181;G06F11/22;(IPC1-7):G01R31/28;G06F12/00 主分类号 G01R31/3183
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