| 摘要 |
The invention relates to a method and device for testing printed circuit boards with a parallel tester. The printed circuit boards comprise strip conductors whose end points are embodied as printed circuit board testing points which can be contacted during testing. The method comprises the following steps; testing a printed circuit board with a parallel tester, whereby the printed circuit board testing points of the printed circuit board are brought into contact with the contact elements of the parallel tester; determining the printed circuit board testing points which are either judged to be unable to be put correctly into contact with the parallel tester or deemed to be basically unable to be put into contact with the parallel tester; and re-measuring the printed circuit board test points judged to be unable to be put correctly into contact or the non contactable printed circuit board test points and also the strip conductors connected to said points by means of a device which is independent from the contact elements in the parallel tester. |
