发明名称 QUALITY DETERMINATION SYSTEM OF ELECTRON BEAM IRRADIATION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a quality determination system of an electron beam irradiation device capable of accurately determining the dose of electron beams irradiated to an irradiated article. SOLUTION: The quality determination system is for guaranteeing the dose of electron beams to be irradiated to an irradiated article by the electron beam irradiation device for achieving the initial purpose such as sterilization by irradiating electron beams. In the quality determination system, the time to start the irradiation and the time to finish the irradiation of electron beams to the irradiated article are calculated from the time series position information and the conveyor speed detected by at least one sensor disposed inside an electron beam irradiation chamber on the upstream side or downstream side of the electron beam irradiation region, and it is determined whether the dose of electron beams extracted from the time series data such as the output, irradiation width, and conveyor speed of the electron beam irradiation device recorded at the same time holds a prescribed quantity within the electron beam irradiation time.
申请公布号 JP2003153985(A) 申请公布日期 2003.05.27
申请号 JP20010354480 申请日期 2001.11.20
申请人 MITSUBISHI HEAVY IND LTD 发明人 YAMAKAWA TAKASHI
分类号 G21K5/00;A61L2/08;G21K5/04;G21K5/10 主分类号 G21K5/00
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