发明名称 METHOD FOR DETERMINING ARC PATTERN HEIGHT
摘要 FIELD: forensic medicine. SUBSTANCE: method involves finding the most curved papillary line of arc pattern, marking the line, measuring bending angle and assigning the obtained angle to papillary pattern height category of common use in dermatoglyphics to determine in indirect way the most curved papillary line height by means of measuring its bending angle and to use this value as a characteristic feature of papillary pattern of given type. EFFECT: high accuracy in identifying papillary patterns of fingerprints. 3 dwg
申请公布号 RU2204941(C1) 申请公布日期 2003.05.27
申请号 RU20010126514 申请日期 2001.10.03
申请人 124 TSENTRAL'NAJA LABORATORIJA (MEDIKO-KRIMINALISTICHESKOJ IDENTIFIKATSII MO RF) 发明人 RAKITINA S.A.
分类号 A61B5/117 主分类号 A61B5/117
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