发明名称 Device and method for manufacturing semiconductor
摘要 A heat exchange section (72) is provided in the middle of a circulation water path (58, 59) connecting between a temperature-controlled water tank (71) and a semiconductor manufacturing apparatus body (4) so as to perform a heat exchange with air of a clean room (3). The heat exchange section (72) is installed near an exit of an air circulation path (32) above a fan-filter unit (34) of the clean room as a temperature stabilized area off an atmosphere of the clean room (3). Additionally, as another method, a temperature of a chemical fluid from a chemical fluid tank (6) is controlled to be a temperature of the air in the clean room by a heat exchange section (61) provided in a location the same as above without using the temperature-controlled water so as to supply the chemical fluid to the semiconductor manufacturing apparatus body (4).
申请公布号 US6569696(B2) 申请公布日期 2003.05.27
申请号 US20020148664 申请日期 2002.06.04
申请人 TOKYO ELECTRON LIMITED;TAISEI CORPORATION 发明人 SUENAGA OSAMU;YAMAMOTO MAKOTO;MORI NAOKI;ITO HIROMU;KOBAYASHI SADAO
分类号 G03F7/30;F24F3/16;F24F5/00;H01L21/00;H01L21/02;H01L21/027;(IPC1-7):G01R31/26;H01L21/66;B01L1/04 主分类号 G03F7/30
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