APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR DEVICE IN SEMICONDUCTOR DEVICE ASSEMBLY PROCESS

摘要

PURPOSE: An apparatus and a method for testing a semiconductor device in a semiconductor device assembly process are provided to minimize an influence of a test result to a test device by controlling a period and a cycle of a pulse applied to a test circuit. CONSTITUTION: A test logic(10) is activated in response to a signal for activating a processed semiconductor device. The test logic receives a pulse and generates a test start signal. An oscillator block(20) is operated in response to the test start signal of the test logic. The oscillator block is used for controlling a period of the pulse and a cycle of the pulse in order to test the semiconductor device. The cycle of pulse is counted by a plurality of flipflops and a plurality of multiplexers. A controller block(30) is used for generating a test completion signal.