发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND APPARATUS FOR FORMING THIN FILM
摘要 PROBLEM TO BE SOLVED: To prevent adverse effects on the interface between silicon and a thin film due to organic contamination, when the thin film is formed on the silicon surface of a substrate having the silicon surface. SOLUTION: A method for manufacturing a semiconductor device comprises a thin-film forming process for forming the thin film on the silicon surface of the substrate, having the silicon surface. The thin film forming process comprises the steps of increasing the temperature to a first temperature region, so that the silicon surface becomes non-contact with an oxidizing gas, subjecting the silicon surface to a first thin-film forming treatment in the first temperature region, and subjecting the silicon surface, subjected to the thin-film forming treatment, to a second thin-film forming treatment in a second temperature region higher than the first temperature region.
申请公布号 JP2003151977(A) 申请公布日期 2003.05.23
申请号 JP20010347441 申请日期 2001.11.13
申请人 MITSUBISHI ELECTRIC CORP 发明人 KAWASE KAZUMASA;UMEDA KOJI;TERAMOTO AKINOBU;WAKAO KAZUTOSHI
分类号 H01L29/78;H01L21/31;H01L21/316;(IPC1-7):H01L21/316 主分类号 H01L29/78
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