发明名称 TEST DEVICE AND METHOD FOR AUTOMATIC CONTROL FUNCTION
摘要 <p>PROBLEM TO BE SOLVED: To provide the test device and method of an automatic control function capable of easily performing a test, and obtaining a highly reliable test result. SOLUTION: A test device 1 fetches management point data from a facility GW3 through an interface 1A, and calculates control feedback quantity from the management point data, and outputs the control feedback quantity from a sequencer 1C to remote equipment 4A and 4B, and stores the control feedback quantity as judgement data, and compares a test result to be calculated by the facility GW3 from signals from the remote equipment 4A and 4B with the judgement data.</p>
申请公布号 JP2003150239(A) 申请公布日期 2003.05.23
申请号 JP20010351243 申请日期 2001.11.16
申请人 YAMATAKE BUILDING SYSTEMS CO LTD 发明人 NARITA KAZUO
分类号 G05B23/02;H04Q9/00;(IPC1-7):G05B23/02 主分类号 G05B23/02
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