发明名称 APPARATUS FOR WAFER-EDGE POLISHING PROCESSING
摘要 PROBLEM TO BE SOLVED: To reduce the occupied area of an apparatus. SOLUTION: This apparatus for wafer-edge polishing processing is constituted such that in the first-floor section 1 of a two-story construction 3, a wafer-edge polisher 10 and a dryer 30 are installed in parallel, and in the second-floor section 2, first and second cleaning apparatuses 20A, 20B are installed in parallel. In the front part of the two-story construction 3, first and second transfer machines 50A, 50B are installed, and a third transfer machine 60 is installed between the first and second cleaning apparatuses 20A, 20B, while in the front side of the first and second transfer machines 50A, 50B, a loader 40A for placing cassettes 41, 42 in which wafers 5 have been loaded, and an unloader 40B for placing cassettes 41, 42 to which the wafers 5 are to be loaded, are provided.
申请公布号 JP2003151925(A) 申请公布日期 2003.05.23
申请号 JP20010345774 申请日期 2001.11.12
申请人 YAC CO LTD;HITACHI LTD 发明人 TSUJI SHINJI;MUTO YASUSHI;KANAI FUMIYUKI;ARAI TOSHIYUKI
分类号 B24B9/00;H01L21/304;(IPC1-7):H01L21/304 主分类号 B24B9/00
代理机构 代理人
主权项
地址