发明名称 |
CLEANING AGENT, CLEANING AGENT MANUFACTURING APPARATUS, METHOD AND SYSTEM OF CLEANING |
摘要 |
PROBLEM TO BE SOLVED: To satisfactorily effectively clean a semiconductor wafer. SOLUTION: Cleaning of a semiconductor wafer 3 is carried out by spraying a cleaning agent 1 together with a carrier gas 37 toward the semiconductor wafer 3 from spray guns 34. The cleaning agent 1 is a solid-liquid sherbet-like material, containing ice particles. The cleaning agent 1 is obtained by cooling a mixed liquid of cleaning pure water 1a and isopropyl alcohol 1b stored in a manufacturing container 7 to the freezing point of water or below by a mechanical freezer 8, while the mixed liquid is stirred by stirring vanes 15. The isopropyl alcohol concentration in the cleaning agent 1 is set at 1 to 80 mass%, while the ice concentration is 0.2 to 99 mass%. The cleaning agent 1 is supplied to pressurization tanks 40 from the manufacturing vessel 7, and then a pressurized gas 35 is supplied to the pressurizing tanks 40 to force-feed the cleaning agent 1 to the spray guns 34 through cleaning agent force feed paths 42.
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申请公布号 |
JP2003151942(A) |
申请公布日期 |
2003.05.23 |
申请号 |
JP20010350939 |
申请日期 |
2001.11.16 |
申请人 |
TAIYO TOYO SANSO CO LTD |
发明人 |
HAYASHI KAZUHITO;HIROI TAKAHIKO;TADA MASUTA |
分类号 |
G02F1/13;B08B3/02;B08B3/10;B08B5/02;C03C23/00;C11D7/04;C11D7/26;H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
G02F1/13 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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