| 摘要 |
PROBLEM TO BE SOLVED: To more efficiently and easily verify a design of a large-scale ASIC. SOLUTION: The test bench for verification capable of easily switching an actual circuit to a dummy circuit for respective function modules on the ASIC is fabricated. Thus, at the time of verifying a certain module, by turning the other modules to the dummy circuits and verifying it, generation of an event at the time of a simulation is suppressed and the simulation is accelerated. Also, since only one test bench is prepared and it is not required to prepare the test benches for checking the respective modules, the test bench is easily maintained and managed.
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