| 摘要 |
PURPOSE: An image sensor for measuring dark current is provided to be capable of reducing dark current by using a test pattern. CONSTITUTION: An image sensor for measuring dark current comprises a pixel array for driving the image sensor and a test pattern for measuring the dark current generated at interface between an active and field region. The test pattern further includes the first test pattern(A,B,C) having the first photodiode and the second test pattern(A',B',C') having the second photodiode. At this time, the area and the size of depletion region of the second photodiode is substantially same to the first photodiode.
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