发明名称 ETCHING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an etching method for obtaining a superior etching face, even when RIE (reactive ion etching) is carried out for an SiC substrate and the like. SOLUTION: A laminated pattern 5, with a prescribed pattern which includes a metallic pattern 21 of a metal layer and a resist pattern 31 as an resist layer covering the metallic layer, is provided at the main face of an SiC substrate as a base. The etching method includes a base etching step of carrying out RIE (reactive ion etching) on the SiC substrate with a mask of the laminated pattern 5.
申请公布号 JP2003151953(A) 申请公布日期 2003.05.23
申请号 JP20010350082 申请日期 2001.11.15
申请人 SUMITOMO ELECTRIC IND LTD 发明人 HARADA MAKOTO;HIROTSU KENICHI;HATSUKAWA SATOSHI;FUJIKAWA KAZUHIRO;HOSHINO TAKASHI
分类号 H01L21/302;H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/302
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