发明名称 POLISHING PAD CONDITIONER OF CHEMICAL MECHANICAL POLISHER, AND METHOD OF CONDITIONING POLISHING PAD
摘要 PROBLEM TO BE SOLVED: To provide a polishing pad conditioner for restoring the surface of a polishing pad to its original state, when the polishing pad used for chemical mechanical polishing of the surface of a wafer has become a defective planarization, and also to provide a method of conditioning the polishing pad. SOLUTION: The polishing pad conditioner comprises a bite 26 provided with a grinding chip 27 at the tip; a horizontal movement means, which comprises a horizontal slide section 32 for fixing the bite 26 and moving nearly in parallel with the surface of a polishing pad 24 and a horizontal case section 34 for guaranteeing the moving path of the horizontal slide 32; a base section 42 for supporting the horizontal case 34 of the horizontal movement means; and a vertical movement means, consisting a first level screw 28 for adjusting the position of the bite 26 in the vertical directions. The polishing pad conditioner also comprises a tilt adjustment means which comprises a second level screw 38 installed at one end of the base section 42, to adjust an angle formed by a horizontal moving path of the horizontal slide 32 and the surface of the polishing pad 24, and a hinge joint section 36 for fixing one point of the horizontal case 34 to the base section 42.
申请公布号 JP2003151935(A) 申请公布日期 2003.05.23
申请号 JP20010375870 申请日期 2001.12.10
申请人 SAMSUNG ELECTRO MECH CO LTD 发明人 YOON JEONG-GOO;PARK JU-YOUNG
分类号 B24B53/007;B24B53/017;B24B53/02;B24B53/12;H01L21/304 主分类号 B24B53/007
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