发明名称 SEMICONDUCTOR PHOTODETECTING ELEMENT
摘要 PROBLEM TO BE SOLVED: To suppress variantion in photodetection characteristic by securing high dimensional stability. SOLUTION: A semiconductor photodetecting element which has a lower clad layer 2, a light absorbing layer 3, and an upper clad layer 14 laminated on a semiconductor substrate 14 in this order, and carriers generated by absorbing light 15, made incident on a light incidence end surface 10 of the semiconductor substrate 14 and inputted to the light absorbing layer 3 through the lower clad layer 2, and absorbed by the light absorbing layer 3, are output as signal to the outside from a pair of electrodes 6 and 7 through the upper clad layer and lower clad layer. A light incidence end surface 10 is formed on an end surface perpendicular to a bottom surface 14a of the semiconductor substrate 14, and the lower clad layer 2, light absorbing layer 3, and upper clad layer 4 are formed on an oblique surface 14c slanting to the bottom surface 14a of the semiconductor substrate 14.
申请公布号 JP2003152216(A) 申请公布日期 2003.05.23
申请号 JP20010352039 申请日期 2001.11.16
申请人 ANRITSU CORP 发明人 YOSHIDAYA HIROAKI
分类号 H01L31/10;(IPC1-7):H01L31/10 主分类号 H01L31/10
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