发明名称 FABRICATION METHOD OF SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a method for fabricating a superior crystalline semiconductor film, without increasing the concentration in a catalyst element to be added to an amorphous semiconductor film and further without making complex a crystallization process. SOLUTION: An insulating film having stress, whose absolute value is at least 3×10<9> dynes/cm<2> , is formed on an amorphous semiconductor film that is formed on an insulator, an opening is provided for forming a mask insulating film, a catalyst element is added to the selective region of the amorphous semiconductor film for carrying out heating treatment, and a crystalline semiconductor film is formed.</p>
申请公布号 JP2003151905(A) 申请公布日期 2003.05.23
申请号 JP20010351808 申请日期 2001.11.16
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 MAEKAWA SHINJI
分类号 G02F1/1333;G02F1/1368;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20;G02F1/136;G02F1/133 主分类号 G02F1/1333
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