发明名称 METHOD FOR EVALUATING IMAGING PERFORMANCE OF TRANSFER/ EXPOSURE APPARATUS, METHOD FOR ADJUSTING TRANSFER/ EXPOSURE APPARATUS, AND PATTERN FOR EVALUATION
摘要 PROBLEM TO BE SOLVED: To provide a method for evaluating the imaging performance of a transfer/exposure apparatus which can adjust astigmatism and focus easily and efficiently. SOLUTION: A subfield 51 of an evaluating pattern 50 is divided into four regions S so that lines and spaces are extended in an X direction in regions S2 and S4, while the lines and spaces are extended in a Y direction in regions S1 and S3. When the pattern 50 for evaluation is transferred to develop a resist film, light and dark patterns are generated on a resist pattern. Imaging performance (astigmatism or focus) is compared by observing the light and dark patterns using an optical microscope.
申请公布号 JP2003151899(A) 申请公布日期 2003.05.23
申请号 JP20020249952 申请日期 2002.08.29
申请人 NIKON CORP 发明人 YAHIRO TAKEHISA;SUGANUMA WAKAKO
分类号 G03F7/207;H01J37/153;H01J37/305;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/207
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