发明名称 |
METHOD FOR EVALUATING IMAGING PERFORMANCE OF TRANSFER/ EXPOSURE APPARATUS, METHOD FOR ADJUSTING TRANSFER/ EXPOSURE APPARATUS, AND PATTERN FOR EVALUATION |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for evaluating the imaging performance of a transfer/exposure apparatus which can adjust astigmatism and focus easily and efficiently. SOLUTION: A subfield 51 of an evaluating pattern 50 is divided into four regions S so that lines and spaces are extended in an X direction in regions S2 and S4, while the lines and spaces are extended in a Y direction in regions S1 and S3. When the pattern 50 for evaluation is transferred to develop a resist film, light and dark patterns are generated on a resist pattern. Imaging performance (astigmatism or focus) is compared by observing the light and dark patterns using an optical microscope.
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申请公布号 |
JP2003151899(A) |
申请公布日期 |
2003.05.23 |
申请号 |
JP20020249952 |
申请日期 |
2002.08.29 |
申请人 |
NIKON CORP |
发明人 |
YAHIRO TAKEHISA;SUGANUMA WAKAKO |
分类号 |
G03F7/207;H01J37/153;H01J37/305;H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
G03F7/207 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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