发明名称 |
DRY ETCHER |
摘要 |
PURPOSE: A dry etcher is provided to make a wafer from being contaminated by particles and prevent a process defect by eliminating the particles caused by etch gas remaining on the wafer after a process is completed. CONSTITUTION: A cassette(112) including a wafer is placed on a cassette table(110). The wafer included in the cassette is processed in a process chamber(150). A loadlock chamber temporarily stores the wafer to be processed in the process chamber and the wafer having been processed in the process chamber. A transfer chamber transfers the wafer. A removing unit(200) removes the process gas remaining on the completed wafer.
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申请公布号 |
KR20030039827(A) |
申请公布日期 |
2003.05.22 |
申请号 |
KR20010070990 |
申请日期 |
2001.11.15 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, SANG WON |
分类号 |
H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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