发明名称 DRY ETCHER
摘要 PURPOSE: A dry etcher is provided to make a wafer from being contaminated by particles and prevent a process defect by eliminating the particles caused by etch gas remaining on the wafer after a process is completed. CONSTITUTION: A cassette(112) including a wafer is placed on a cassette table(110). The wafer included in the cassette is processed in a process chamber(150). A loadlock chamber temporarily stores the wafer to be processed in the process chamber and the wafer having been processed in the process chamber. A transfer chamber transfers the wafer. A removing unit(200) removes the process gas remaining on the completed wafer.
申请公布号 KR20030039827(A) 申请公布日期 2003.05.22
申请号 KR20010070990 申请日期 2001.11.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, SANG WON
分类号 H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/3065
代理机构 代理人
主权项
地址