发明名称 Substrate processing method and substrate processing apparatus
摘要 The wafer coated with the resist is deliberately placed in the vapor before being transferred to an aligner that exposes the resist on the wafer, the vapor, for example, the moisture, uniformly adheres onto the resist on the wafer. As a result, the substrate can uniformly be exposed in the following exposing process, and the uniformity of the line width and the like can be improved.
申请公布号 US2003094137(A1) 申请公布日期 2003.05.22
申请号 US20020300760 申请日期 2002.11.21
申请人 TOKYO ELECTRON LIMITED 发明人 MATSUI HIDEFUMI;KITANO JUNICHI
分类号 G03F7/38;H01L21/00;H01L21/027;H01L21/677;(IPC1-7):B05D3/10;B05D3/04;B05D3/02;C23C16/00 主分类号 G03F7/38
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