发明名称 Device manufacturing method
摘要 In-situ cleaning of an optical component for use in a lithographic projection apparatus can be carried out by irradiating a space (2) within the apparatus containing the optical component (3) with UV or EUV radiation having a wavelength of less than 250nm, in the presence of molecular oxygen. Generally, the space will be purged with a purge gas which contains a small amount of molecular oxygen in addition to the usual purge gas composition. The technique can also be used in an evacuated space by introducing a low pressure of molecular oxygen into the space. This technique has the advantage that the use of unstable materials such as ozone is avoided. <IMAGE>
申请公布号 EP1312984(A2) 申请公布日期 2003.05.21
申请号 EP20020257914 申请日期 2002.11.15
申请人 ASML NETHERLANDS B.V. 发明人 VAN SCHAIK, WILLEM;MERTENS, BASTIAAN MATTHIAS;MEILING, HANS;KOSTER, NORBERTUS BENEDICTUS
分类号 G02B17/00;G03F7/20;H01L21/027;(IPC1-7):G03F7/20 主分类号 G02B17/00
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