发明名称 |
SCANNING PROBE MICROSCOPE |
摘要 |
PROBLEM TO BE SOLVED: To provide a scanning probe microscope having a function of discriminating the kinds of probes with an image recognition function in the scanning probe microscope having an optical microscope. SOLUTION: This scanning probe microscope having the optical microscope capable of observing a prove is equipped with an image sensor for taking in an optical microscope image as a digital image; and a processing device processing the image taken in.
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申请公布号 |
JP2003149121(A) |
申请公布日期 |
2003.05.21 |
申请号 |
JP20010352139 |
申请日期 |
2001.11.16 |
申请人 |
SEIKO INSTRUMENTS INC |
发明人 |
UMEKI TAKESHI |
分类号 |
G01B21/00;G01B21/30;G01Q30/00;G01Q60/38;G01Q90/00;G02B21/36;(IPC1-7):G01N13/16;G01N13/10 |
主分类号 |
G01B21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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