发明名称 SCANNING PROBE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a scanning probe microscope having a function of discriminating the kinds of probes with an image recognition function in the scanning probe microscope having an optical microscope. SOLUTION: This scanning probe microscope having the optical microscope capable of observing a prove is equipped with an image sensor for taking in an optical microscope image as a digital image; and a processing device processing the image taken in.
申请公布号 JP2003149121(A) 申请公布日期 2003.05.21
申请号 JP20010352139 申请日期 2001.11.16
申请人 SEIKO INSTRUMENTS INC 发明人 UMEKI TAKESHI
分类号 G01B21/00;G01B21/30;G01Q30/00;G01Q60/38;G01Q90/00;G02B21/36;(IPC1-7):G01N13/16;G01N13/10 主分类号 G01B21/00
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