发明名称 Apparatus for scan testing printed circuit boards
摘要 A scan test apparatus having at least an upper layer of conductive and compliant material and may include a lower layer of conductive and compliant material sized to cover the upper and lower surfaces of the printed circuit board to be tested. Electrical current is introduced into the conductive layers which shorts out the circuits on the printed circuit board. An electrical contactor is positioned on either side of the conductive layers on both sides of the printed circuit board. The printed circuit board is passed through the upper and lower conductive layers and the contactors by rollers positioned on each end of the scan test machine. The contactor sends a test signal from the circuit board to measurement electronics. Other embodiments include the shorting matrix to be movable and the printed circuit board being fixed and include non-contact sensors or arrays of electrical contactors. <IMAGE>
申请公布号 EP1312930(A2) 申请公布日期 2003.05.21
申请号 EP20020025085 申请日期 2002.11.12
申请人 DELAWARE CAPITAL FORMATION, INC. 发明人 SWART, MARK A.
分类号 G01R31/02;G01R31/28;H05K3/00 主分类号 G01R31/02
代理机构 代理人
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