发明名称 SCATTERED LIGHT MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a scattered light measuring device efficiently detecting only scattered light generated by fine particles and detecting even a trace of fine particles in high sensitivity. SOLUTION: This scattered light measuring device measures scattered light S generated by scattering irradiation light emitted from a light source device 2 with fine particles P inside a measuring target material M. A flood unit 5 containing a capillary plate is fit to the tip of a flood cable for guiding the irradiation light L emitted from the light source 2, and the capillary plate is also contained in a light receiving unit 8 receiving the scattered light S. The capillary plates have a plurality of fine holes arranged in parallel, made of a material having light absorbing properties, and the scattered light S passed through the capillary plates is detected with photomultiplier of a light detecting unit 3.
申请公布号 JP2003149125(A) 申请公布日期 2003.05.21
申请号 JP20010350621 申请日期 2001.11.15
申请人 HAMAMATSU PHOTONICS KK 发明人 SUZUKI MAKOTO;KATO HISAYOSHI
分类号 G01N15/06;C12M1/34;G01N21/27;G01N21/49;(IPC1-7):G01N15/06 主分类号 G01N15/06
代理机构 代理人
主权项
地址