发明名称 Continuously variable dummy pattern density generating systems, methods and computer program products for patterning integrated circuits
摘要 Dummy patterns are generated for a region of an integrated circuit that is divided into buckets by obtaining a local pattern density for a respective bucket and adjusting a density of the dummy pattern for the respective bucket as a continuously variable function of the respective local pattern density and a target density for the region. By providing a continuously variable dummy pattern density, the desired density of the dummy pattern group may be adjusted precisely, to thereby reduce or eliminate loading effects. The density of the dummy pattern for the respective bucket may be calculated according to a formula in which the density of the dummy pattern is continuously variable. The dummy patterns may include features of fixed pitch and a size of the features of fixed pitch is increased or decreased as a continuously variable function of the respective local pattern density and the target density for the region.
申请公布号 US6567964(B2) 申请公布日期 2003.05.20
申请号 US20010927124 申请日期 2001.08.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIN JAE-PIL;YOO KWANG-JAI;PARK SANG-HO;YOO MOON-HYUN
分类号 H01L21/027;G06F17/50;H01L21/768;H01L23/522;(IPC1-7):G06F17/50 主分类号 H01L21/027
代理机构 代理人
主权项
地址