发明名称 Method of removing ink from a semiconductor wafer
摘要 A cleaning method to remove ink from the surface of a semiconductor wafer includes securing the wafer to a spin chuck, submerging the spinning wafer into an N-Methyl-Pyrolidone (NMP) solution to dissolve the ink on the surface of the semiconductor wafer, spraying a cleaning solution onto the surface of the spinning wafer to clean the ink off the surface of the wafer, and blowing gas onto the surface of the spinning wafer so as to remove residue from the surface of the wafer.
申请公布号 US6565670(B2) 申请公布日期 2003.05.20
申请号 US20020683471 申请日期 2002.01.03
申请人 UNITED MICROELECTRONICS CORP. 发明人 HSIEH HSIU-CHU;HORNG JASON;HSIA JASON
分类号 B08B3/02;B08B5/02;H01L21/00;(IPC1-7):B08B3/08 主分类号 B08B3/02
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