发明名称 |
Temperature measurement device |
摘要 |
An apparatus includes a substrate and a resistive element attached to a region of the substrate and formed of a first material having a first temperature coefficient of resistivity. In addition, the apparatus includes a pair of traces coupled to the resistive element, attached to the substrate, and formed of a second material having a second temperature coefficient of resistivity with the first material selected so that the first temperature coefficient of resistivity exceeds the second temperature coefficient of resistivity. An apparatus includes a substrate and a resistive element disposed onto a first region of the substrate and formed of a first material having a first temperature coefficient of resistivity. In addition, the apparatus includes a pair of traces coupled to the resistive element and each formed of a first plurality of sections of a second material having a second temperature coefficient of resistivity and a second plurality of sections of a third material having a third temperature coefficient of resistivity.
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申请公布号 |
US6565178(B1) |
申请公布日期 |
2003.05.20 |
申请号 |
US20010002751 |
申请日期 |
2001.10.29 |
申请人 |
HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. |
发明人 |
GIERE MATTHEW D;PRAKASH SATYA;BARBOUR MICHAEL J. |
分类号 |
B41J2/05;B41J2/14;(IPC1-7):B41J29/38 |
主分类号 |
B41J2/05 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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