发明名称 Temperature measurement device
摘要 An apparatus includes a substrate and a resistive element attached to a region of the substrate and formed of a first material having a first temperature coefficient of resistivity. In addition, the apparatus includes a pair of traces coupled to the resistive element, attached to the substrate, and formed of a second material having a second temperature coefficient of resistivity with the first material selected so that the first temperature coefficient of resistivity exceeds the second temperature coefficient of resistivity. An apparatus includes a substrate and a resistive element disposed onto a first region of the substrate and formed of a first material having a first temperature coefficient of resistivity. In addition, the apparatus includes a pair of traces coupled to the resistive element and each formed of a first plurality of sections of a second material having a second temperature coefficient of resistivity and a second plurality of sections of a third material having a third temperature coefficient of resistivity.
申请公布号 US6565178(B1) 申请公布日期 2003.05.20
申请号 US20010002751 申请日期 2001.10.29
申请人 HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. 发明人 GIERE MATTHEW D;PRAKASH SATYA;BARBOUR MICHAEL J.
分类号 B41J2/05;B41J2/14;(IPC1-7):B41J29/38 主分类号 B41J2/05
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