发明名称 Method of producing a semiconductor surface covered with fluorine
摘要 Fluorine is deposited on a semiconductor substrate surface according to a novel process. A semiconductor substrate is placed in a reaction chamber and the substrate surface is wetted with water and/or alcohol. A compound containing fluorine is led to the substrate surface, so that a cleaned semiconductor surface covered with fluorine is produced, and the compound containing fluorine is removed from the reaction chamber. The cleaned semiconductor surface covered with fluorine is then wetted with a mixture containing at least 10% by volume of water and at least 10% by volume of alcohol, for producing a cleaned semiconductor surface covered with a predetermined amount of fluorine. The predetermined amount of fluorine is lower the higher a proportion of water in the mixture is chosen to be. Then, the water and the alcohol are removed from the semiconductor surface.
申请公布号 US6566271(B1) 申请公布日期 2003.05.20
申请号 US20000671827 申请日期 2000.09.27
申请人 INFINEON TECHNOLOGIES AG 发明人 GSCHWANDTNER ALEXANDER;INNERTSBERGER GUDRUN;GRASSL ANDREAS;FROESCHLE BARBARA;KERBER MARTIN;MATTHEUS ALEXANDER
分类号 H01L21/304;H01L21/306;H01L21/316;(IPC1-7):H01L21/302 主分类号 H01L21/304
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