发明名称 Testing of digital-to-analog converters
摘要 A technique for testing digital-to-analog converters includes providing a set of digital input signals to the digital-to-analog converters and comparing a resulting combined output signal from the digital-to-analog converters to a comparison value. A determination is made as to whether the resulting combined output signal is within a predetermined tolerance defined by the comparison value. An apparatus for testing digital-to-analog converters also is disclosed.
申请公布号 US6566857(B1) 申请公布日期 2003.05.20
申请号 US19990468201 申请日期 1999.12.20
申请人 INTEL CORPORATION 发明人 KAKIZAWA AKIRA;ORTEGA CARLOS A.;ARELLANO MARK A.
分类号 G09G3/00;H03M1/10;H03M1/66;(IPC1-7):G01R19/18 主分类号 G09G3/00
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