发明名称 |
Testing of digital-to-analog converters |
摘要 |
A technique for testing digital-to-analog converters includes providing a set of digital input signals to the digital-to-analog converters and comparing a resulting combined output signal from the digital-to-analog converters to a comparison value. A determination is made as to whether the resulting combined output signal is within a predetermined tolerance defined by the comparison value. An apparatus for testing digital-to-analog converters also is disclosed.
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申请公布号 |
US6566857(B1) |
申请公布日期 |
2003.05.20 |
申请号 |
US19990468201 |
申请日期 |
1999.12.20 |
申请人 |
INTEL CORPORATION |
发明人 |
KAKIZAWA AKIRA;ORTEGA CARLOS A.;ARELLANO MARK A. |
分类号 |
G09G3/00;H03M1/10;H03M1/66;(IPC1-7):G01R19/18 |
主分类号 |
G09G3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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