发明名称 PATTERN TRANSFER METHOD IN MANUFACTURING OF SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a pattern transfer method which can repeatedly obtain high resolution patterns in an easy manner, using a low-cost aligner. SOLUTION: A resist film of double-layer structure, consisting of a photosensitive resist film 5 as the lower layer and a polymer material film 2, having the UV-shielding effects as the surface layer, is formed on a substrate 4. A casting die 3 is pressed against the polymer material film 2 for forming the circuit pattern in ruggedness shapes 2a, 2b. These circuit patterns are exposed with UV rays and are then developed through wet etching process. In projected sections 2a, UV rays are fully shielded, while in recessed sections 2b, UV rays are partially transmitted. Accordingly, almost parallel UV rays reach the photosensitive resist film 5, even if UV rays do not form a strictly parallel beam.</p>
申请公布号 JP2003142399(A) 申请公布日期 2003.05.16
申请号 JP20020243364 申请日期 2002.08.23
申请人 ISHIKAWA SEISAKUSHO LTD;MATSUMURA HIDEKI 发明人 MATSUMURA HIDEKI;TERANO MINORU;NITTA KOHEI;KIDA KENICHIRO
分类号 G03F7/11;G03F1/54;G03F1/56;G03F7/20;H01L21/027;(IPC1-7):H01L21/027;G03F1/08 主分类号 G03F7/11
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