MEMORY TEST DEVICE AND METHOD, PROGRAM STORAGE MEDIUM, AND PROGRAM

摘要

PROBLEM TO BE SOLVED: To provide a memory test device and method, program recording medium, and a program for shortening the time required for a test even for a memory to be tested of which data bus width is large. SOLUTION: This memory test device is provided with: a memory 3 for test program storing a program for testing a memory 2 to be tested; and a memory 4 for test data pattern group storing a test data pattern group used for a test. A bit column generated by repeating division into two parts of a binary number column consisting of the same bits as the data bus width of the memory 2 to be tested is used for the test data pattern group.