发明名称 Method and apparatus for processing wafers under pressure
摘要 A system for high-pressure drying of semiconductor wafers includes the insertion of a wafer into an open vessel, the immersion of the wafer in a liquid, pressure-sealing of the vessel, pressurization of the vessel with an inert gas, and then the controlled draining of the liquid using a moveable drain that extracts water from a depth maintained just below the gas-liquid interface. Thereafter, the pressure may be reduced in the vessel and the dry and clean wafer may be removed. The high pressure suppresses the boiling point of liquids, thus allowing higher temperatures to be used to optimize reactivity. Megasonic waves are used with pressurized fluid to enhance cleaning performance. Supercritical substances are provided in a sealed vessel containing a wafer to promote cleaning and other treatment.
申请公布号 US2003088995(A1) 申请公布日期 2003.05.15
申请号 US20020334457 申请日期 2002.12.30
申请人 SEMITOOL, INC. 发明人 BERGMAN ERIC J.;SHARP IAN;MEUCHEL CRAIG P.;WOODS H. FREDERICK
分类号 B08B7/00;B08B3/10;B08B3/12;F26B5/14;H01L21/00;H01L21/304;H01L21/677;(IPC1-7):F26B5/04 主分类号 B08B7/00
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