| 摘要 |
<p>A test apparatus for testing an electronic device. The test device includes a pattern generator for generating a test pattern for testing an electronic device, a reference clock generator for generating a reference clock, a timing generator for generating a timing, and a sampling circuit for sampling at the timing generated by the timing generator an output signal output by the electronic device according to the test pattern. The timing generator has a variable delay circuit unit for receiving the reference clock and outputting the reference clock with a delay and a delay control unit for controlling the delay amount in the variable delay circuit unit. The delay control unit controls the delay amount according to basic timing data and a variable delay amount smaller than the basic timing data.</p> |
