| 摘要 |
On the side for feeding test data, a data row is divided every n cycles n is a positive integer, i.e. every n bits, to determine the displacement of continuous n bit data. It is then divided by "n2" and the remainder is converted into data represented by output states of "Z", "0" and "1" thus feeding the data while compressing. On the side for receiving the data, received data is decompressed to recover the original data and an electronic component is tested based on the decompressed test data.
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