发明名称 NON-VOLATILE MEMORY WITH TEMPERATURE-COMPENSATED DATA READ
摘要 A novel non-volatile memory is disclosed. The non-volatile memory including an array of data storage cells that individually include a storage element (43) such as a floating gate, a control gate and first and second source/drain terminals. A current source (61) provides a current to the first source/drain terminal of the data storage element. A node (75) is electrically connected to the second source/drain terminal of the data storage element. A bias circuit (73, 69) provides a bias voltage to the node. The bias voltage varies with temperature in a manner approximately inverse to the thermal variation of the threshold voltage of the data storage element. A control gate voltage circuit provides a voltage level to the control gate of the data storage cell.
申请公布号 WO03041082(A1) 申请公布日期 2003.05.15
申请号 WO2002US34236 申请日期 2002.10.24
申请人 SANDISK CORPORATION 发明人 CERNEA, RAUL-ADRIAN
分类号 G11C16/06;G11C7/12;G11C16/02;G11C16/04;G11C16/26;G11C16/28;(IPC1-7):G11C/704 主分类号 G11C16/06
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