发明名称 Substrate processing apparatus and substrate processing method
摘要 An aging unit (DAC) for processing a wafer W having a coated film formed thereon includes a disposing plate, a temperature control circulating device for controlling the temperature of the disposing plate, a chamber, a gas supply mechanism for supplying an ammonia gas containing a water vapor into the chamber, an input section for inputting the processing time of the wafer W, and a control device for controlling the temperature of the disposing plate, the supply rate of the ammonia gas, and the amount of the water vapor contained in the ammonia gas so as to permit the processing of the wafer W to be finished in the processing time inputted into the input section.
申请公布号 US2003091728(A1) 申请公布日期 2003.05.15
申请号 US20020290351 申请日期 2002.11.08
申请人 TOKYO ELECTRON LIMITED 发明人 UEDA YUJI
分类号 B05D3/10;B05C9/14;H01L21/00;H01L21/31;(IPC1-7):B05D3/12;B05D5/12 主分类号 B05D3/10
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