发明名称 METHOD AND DEVICE FOR MEASURING DIELECTRIC CONSTANT
摘要 The sample measuring face of a dielectric resonator (20) is placed near a standard sample having a known dielectric constant at a fixed interval D. While appropriately varying the dielectric constant and thickness of the standard sample under the above condition, the variation of the resonance frequency of the dielectric resonator (20) is measured for each varied dielectric constant and thickness to draw a calibration curve of the varied resonance frequency depending on the dielectric constant and thickness. Under the same condition where calibration curve is drawn, the variation of the resonance frequency of the dielectric resonator (20) for a sample having a known thickness is measured The dielectric constant of the sample is found from the measurement value and the calibration curve. The dielectric constant of not only a sheetlike sample but also a three-dimensional molded article or a liquid sample can be measured easily. <IMAGE>
申请公布号 EP1116951(A4) 申请公布日期 2003.05.14
申请号 EP19990944823 申请日期 1999.09.27
申请人 OJI PAPER CO., LTD. 发明人 NAGATA, SHINICHI;MIYAMATO, SEIICHI;OKADA, FUMIAKI
分类号 G01N22/00;G01R27/26 主分类号 G01N22/00
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