发明名称 Nonvolatile memory device having data read operation with using reference cell and method thereof
摘要 <p>A semiconductor memory device as claimed in the present invention has a reference cell, a first memory cell, a second memory cell located nearer the first memory cell than the reference cell and a data read circuit provided therein. The data read circuit identifies first data stored in the first memory cell based on a reference cell electrical state of the reference cell and a first electrical state of the first memory cell. Furthermore, the data read circuit identifies second data stored in the second memory cell based on the first electrical state of the first memory cell and a second electrical state of the second memory cell. The semiconductor memory device having such configuration is able to suppress influence of variation in electrical performance of memory cell and stably identify data stored in a memory cell. &lt;IMAGE&gt;</p>
申请公布号 EP1310961(A2) 申请公布日期 2003.05.14
申请号 EP20020024746 申请日期 2002.11.06
申请人 NEC ELECTRONICS CORPORATION 发明人 OKAZAWA, TAKESHI;TAHARA, SHUUICHI
分类号 G11C11/16;G11C11/14;G11C11/15;G11C16/04;G11C16/06;(IPC1-7):G11C11/16 主分类号 G11C11/16
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