发明名称 |
PHOTOSENSITIVE POLYMER COMPOSITION, METHOD FOR MANUFACTURING RELIEF PATTERN, AND ELECTRONIC PARTS |
摘要 |
PROBLEM TO BE SOLVED: To provide a positive heat-resistant photosensitive polymer composition having high sensitivity and resolution, forming a pattern with a favorable profile and requiring a short developing time and to provide a method for manufacturing a relief pattern and electronic parts with high reliability by using the composition. SOLUTION: The photosensitive polymer composition contains (a) a polyimide acid ester or polyimide soluble with an alkali aqueous solution, (b) a compound which generates an acid by light and (c) a compound having a phenolic hydroxyl group. The component (a) is a polyamide acid ester having the repeating unit expressed by general formula (I). In the formula, R<1> represents a tetravalent organic group, R<2> represents a bivalent organic group having a carboxyl group or a phenolic hydroxyl group, and each of two R<3> independently represents a monovalent organic group. The method for manufacturing a relief pattern includes a process of applying the above photosensitive polymer composition onto a supporting substrate. The electronic parts have the relief pattern obtained by the above method as a surface protective film or an interlayer insulating film. |
申请公布号 |
JP2003140340(A) |
申请公布日期 |
2003.05.14 |
申请号 |
JP20020211664 |
申请日期 |
2002.07.19 |
申请人 |
HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD |
发明人 |
NUNOMURA MASATAKA;OE TADAYUKI |
分类号 |
G03F7/037;C08G73/10;G03F7/004;G03F7/022;H01L21/027;H01L21/312 |
主分类号 |
G03F7/037 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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