发明名称 JITTER MEASURING INSTRUMENT AND SEMICONDUCTOR INTEGRATED CIRCUIT TESTING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a jitter measuring instrument which measures the phase difference between the pulses before and behind an arbitrary pulse contained in pulse signals. SOLUTION: This jitter measuring instrument is provided with a pulse dividing means which generates first and second signals by dividing the pulse signals every other pulse, a first flip flop which is set by means of the first signal and reset by means of the second signal, and a second flip flop set by means of the second signal and reset by means of the first signal. This instrument is also provided with a first integrator which integrates first output signals outputted from the first flip flop, a second integrator which integrates second output signals outputted from the second flip flop, and a first maximum value detecting means which detects the first maximum value of first integrated signals outputted from the first integrator. In addition, this instrument is also provided with a second maximum value detecting means which detects the maximum value of second integrated signals outputted from the second integrator and a level discriminating means which detects the phase difference of the pulse signals as the difference between the first and second maximum values.
申请公布号 JP2003139821(A) 申请公布日期 2003.05.14
申请号 JP20010333396 申请日期 2001.10.30
申请人 KYUSHU ANDO DENKI KK;ANDO ELECTRIC CO LTD 发明人 MOCHITOME ATSUNARI
分类号 G01R29/02;G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R29/02
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